DUBLIN--(BUSINESS WIRE)--Research and Markets has announced the addition of the "Automated Optical Inspection System Market by Type (2D AOI Systems, 3D AOI Systems), Technology, Element, Application ...

WESTBOROUGH, Mass.--(BUSINESS WIRE)--Kopin Corporation (NASDAQ: KOPN) a leading provider of application-specific optical systems and high-performance microdisplays for defense, enterprise, industrial, ...

In contrast to manual inspection by trained employees, the automatic visual inspection systems always work objectively based on individual criteria and are not influenced by the condition of the ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Sensofar’s S neox Five Axis 3D optical ...

Mirtec, the South Korea–based manufacturer of optical inspection equipment, will showcase its latest semiconductor inspection system at Semicon West 2025 in Phoenix next month, as competition ...

Driven by the continued decrease in the size of electronics packaging, combined with the increase in density, there is a critical need for highly accurate 3D inspection for defect detection. Using ...

Shenzhen, China, Sept. 22, 2025 (GLOBE NEWSWIRE) -- Lianhe Sowell International Group Ltd (Nasdaq: LHSW) (the “Company” or “Lianhe Sowell”) today announced that it has signed a series of supply ...

Two new Omron automated optical inspection (AOI) systems have been released: the VT-Z600 and VT-S1040. The VT-Z600 is Omron’s fastest pre/post reflow AOI system. It features multi-direction and ...

Stacking chips is making it far more difficult to find existing and latent defects, and to check for things like die shift, leftover particles from other processes, co-planarity of bumps, and adhesion ...

CHICAGO, IL—According to the new market research report “Automated Optical Inspection System Market by Type (2D AOI Systems, 3D AOI Systems), Technology (Inline AOI, Offline AOI), Industry (Consumer ...

3D optical profiling provides many benefits over other measurement methods used for non-contact inspection of semiconductor packaging front-end process research and control. These benefits range from ...