This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...

The electrical voltage, the resistance of a conductor, or the current passing through a wire are quantities that can be easily measured by using a tester. But if you need to know the capacity of a ...

ALBANY, N.Y., April 9, 2021 /PRNewswire/ -- MTI Instruments, Inc. ("MTI Instruments"), a wholly-owned subsidiary of Mechanical Technology, Incorporated, (NASDAQ: MKTY), announced today that its ...