EDN

Agilent rolls out desktop memory, logic tester

PALO ALTO, Calif.–Agilent Technologies Inc. today rolled out a desktop version of its flash-memory and logic tester line. The Versatest Model V4000 is a complete, single platform that is geared for ...
EDN

Logic Vision and Advantest to Develop Tester Support

San Jose, CA – April 16, 2001 – Logic Vision, Inc., an IP provider of embedded test solutions, and Advantest, an automatic test equipment supplier and producer of electronic and optoelectronic ...
Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

“Think You’re Smart?”: Challenge Yourself With 22 Logic Problems That Will Test Your Reasoning

Think you have a sharp mind? Part 2 of our Logic Test Quiz is here to put your reasoning skills to the ultimate test.From number puzzles and sequences to tricky riddles and brain teasers, every ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...