Boundary Scan technique is most often thought of as a board-level test method, but certain techniques makes system level test with JTAG quite effective. Many types of faults can arise when systems are ...
TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...
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