Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Both scan ATPG and IJTAG patterns are used to test a piece of logic that is part of a much larger SoC design. For both, the patterns are independent of the logic in the actual design. Both patterns ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Shatara Michelle Ford’s lean, smart debut feature confronts us with our presumptions about what rape and victimhood look like — onscreen and in life. By Devika Girish When you purchase a ticket for an ...