Nature

At-Speed Testing and Delay Defect Analysis in Integrated Circuits

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
PR Newswire

Lightium, MPI Corporation, and Axiomatic_AI Announce Strategic Partnership to Revolutionize Photonic Integrated Circuit (PIC) Device Testing with AI-Driven Solutions

ZURICH and HSINCHU and BOSTON, Aug. 5, 2025 /PRNewswire/ -- Lightium AG, MPI Corporation, and Axiomatic_AI Inc. have entered into a Memorandum of Understanding (MoU) to jointly develop the world's ...
JD Supra

Patent Directed to Testing Electronic Circuits Using a Laser Beats § 101 Challenge

Plaintiff SEMICAPS filed suit in the Northern District of California, alleging infringement of U.S. Patent No. 7,623,982, which relates to the testing of electronic circuits using a laser. The ...
Electronic Design

Benchtop Systems for IC Temperature Testing

Efficient cooling and heating with high-watt-emitting devices was recently introduced by InTEST Thermal Solutions. Efficient cooling and heating with high-watt-emitting devices was recently introduced ...