Testing new semiconductor devices like silicon carbide (SiC) and gallium nitride (GaN) often requires complicated setups that ...

Recently, a short circuit testing trial for third-party electric vehicle charging piles has attracted widespread attention. This test aims to verify the protective capabilities and reliability of the ...

Wireless power banks with magnetic adsorption must pass the UL2056 certification test report in order to be sold on major ...

Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...

The Joint Test Action Group (JTAG) was formed in mid 1980s to develop a method of verifying designs and testing printed circuit boards after manufacture. Prior to the development of JTAG, testing and ...

Arithmetic circuit complexity investigates the computational resources required to evaluate polynomial functions via networks of arithmetic operations. At its core, this field seeks to classify ...