Rapidus on Friday announced that it had begun prototyping of test wafers with 2nm gate-all-around (GAA) transistor structures at its IIM-1 facility in Japan. The company confirmed that early test ...
A technical paper titled “Challenges of Wafer-Scale Integration of 2D Semiconductors for High-Performance Transistor Circuits” was published by researchers at Imec. “The introduction of highly scaled ...
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