In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

We incorporate a reduced-rank envelope in an elliptical multivariate linear regression to improve the efficiency of estimation. The reduced-rank envelope model takes advantage of both a reduced-rank ...

Interval-censored multivariate failure time data arise when there are multiple types of failure or there is clustering of study subjects and each failure time is known only to lie in a certain ...