The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

During the late 1960s and most of the 1970s, the composites industry was absorbing the impact of what was then the recent introduction of carbon fiber. The resulting composites exhibited both high ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

This video demonstrates a compression test performed on a paper cup using a compression testing system from Instron. Instron compression testers are used to determine the compressive strength of ...

With every passing day the Mule provides opportunities beyond our original expectations. Since the 467ci engine belongs to HPP editor Tom DeMauro, it is at our beck and call. This affords HPP the ...