Abstract: Testing memory circuits is crucial to ensure the quality of a System on Chip (SoC) as technology nodes shrink, making circuits more prone to defects and reliability issues at nanometer ...
Abstract: This study proposes a power-efficient 28-Gb/s single-ended four-level pulse amplitude modulation (PAM-4) transceiver (TRX) for next-generation memory interfaces. In the transmitter (TX), an ...
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