IEEE

Using Inference and Graph Convolutional Networks for APT Attack Detection

Abstract: In this article, we propose an IG model for detecting APT attacks based on network traffic. The model consists of two main layers: the I layer -Inference layer constructs an IP information ...
IEEE

Use of optical metrology techniques for uniformity Control of 3D stacked IC's

Abstract: This paper describes a study that evaluates various optical metrology techniques for in-line control of the uniformity of 3D stacked structures. Among the 3D process integration flow, key 3D ...